Archive for the ‘express’ Category

TDMS files can store large amounts of test and measurement data. However, when a channel contains an extremely large amount of files, your system can get overloaded. If you want to free up some space and keep your front panel from locking up, this example code can help divide these large channels into smaller segments and add them back together for a more efficient system. Your computer shouldn’t get stuck opening and closing a file 50,000 times just because you have 50,000 samples in one channel.




>>Download the code here.

With the addition of the NI PXIe-6556, NI PXIe-4140 and NI PXIe-4141 instrumentation to the NI PXI platform, engineers working in semiconductor characterization and production test can now significantly reduce their costs and increase efficiency in their projects.


The NI PXIe-6556 high-speed digital I/O with PPMU helps engineers to generate and acquire a digital waveform at up to 200 MHz, perform DC parametric measurements with one percent accuracy on the same pin and nearly eliminate timing skew due to the built-in timing calibration feature. It also provides the option to switch in another NI source measure unit (SMU) for higher precision.


The new NI PXIe-4140/41 SMU modules provide four SMU channels per PXI Express, with sampling rates of up to 600,000 samples per second, which can drastically reduce measurement times. The NI PXIe-4141 SMU features next-generation SourceAdapt technology, so unlike traditional SMU technologies, engineers can custom tune the SMU output response to any given load.


Combined with LabVIEW, the new PPMU and SMU modules add to the modular software-defined  approach to semiconductor test by increasing quality, reducing cost and  decreasing the time of test across validation, characterization and  production.


Get all the details on the new PXI modules by visting